您好, 歡迎來到化工儀器網(wǎng)! 登錄| 免費注冊| 產(chǎn)品展廳| 收藏商鋪|
行業(yè)產(chǎn)品
當前位置:泰州巨納新能源有限公司>>二維材料>>二維材料薄膜>> Monolayer WSe2 Triangles on c-cut Sapphire
產(chǎn)品型號
品 牌2D Semiconductors
廠商性質(zhì)生產(chǎn)商
所 在 地泰州市
更新時間:2024-06-03 19:13:05瀏覽次數(shù):669次
聯(lián)系我時,請告知來自 化工儀器網(wǎng)供貨周期 | 現(xiàn)貨 | 應用領域 | 環(huán)保,化工,能源,綜合 |
---|
Isolated monolayer thickness WSe2 are grown onto c-cut (0001) sapphire substrates. This particular product contains monolayer thickness WSe2 triangular flakes randomly distributed across sapphire substrate. While some regions reach continuity with coalesced WSe2 triangles, this sample contains well-separated triangles for advanced spectroscopy, microscopy, and electronic measurements. Synthesized monolayer WSe2 triangles are highly luminescent and Raman spectroscopy studies also confirm the monolayer thickness.
Sample Properties.
Sample size | 1cm x 1cm square shaped |
Substrate type | (0001) c-cut sapphire |
Coverage | Isolated and partially merged monolayer triangles |
Electrical properties | 1.62 eV Direct Bandgap Semiconductor |
Crystal structure | Hexagonal Phase |
Unit cell parameters | a = b = 0.327 nm, c = 1.295 nm, α = β = 90°, γ = 120° |
Production method | Low pressure Chemical Vapor Deposition (LPCVD) |
Characterization methods | Raman, photoluminescence, TEM, EDS |
Specifications
1) Identification. Well-separated WSe2 domains across c-cut sapphire
2) Physical dimensions. One centimeter in size. Larger sizes up to 2-inch wafer-scale available upon requests.
3) Smoothness. Atomically smooth surface with roughness < 0.22 nm.
4) Uniformity. Highly uniform surface morphology
5) Purity. 99.9995% purity as determined by nano-SIMS measurements
6) Reliability. Repeatable Raman and photoluminescence response
7) Crystallinity. High crystalline quality, Raman response, and photoluminescence emission comparable to single crystalline monolayer flakes.
8) Substrate. c-cut Sapphire but our research and development team can transfer WSe2 triangles onto variety of substrates including PET, quartz, and SiO2/Si without significant compromising of material quality.
9) Defect profile. WSe2 monolayer triangles do not contain intentional dopants or defects. However, our technical staff can produce defected WSe2 using α-bombardment technique.
Supporting datasets [for 100% Full area coverage on SiO2/Si]
Transmission electron images (TEM) acquired from CVD grown WSe2 (triangular) monolayers on sapphire confirming highly crystalline nature of monolayers
Room temperature photoluminescence spectroscopy (PL) and Raman spectroscopy (Raman) measurements performed on CVD grown WSe2 triangle monolayers on c-cut sapphire. Raman spectroscopy measurement confirm monolayer nature of the CVD grown samples and PL spectrum display sharp and bright PL peak located at 1.62 eV in agreement with the literature.
請輸入賬號
請輸入密碼
請輸驗證碼
以上信息由企業(yè)自行提供,信息內(nèi)容的真實性、準確性和合法性由相關企業(yè)負責,化工儀器網(wǎng)對此不承擔任何保證責任。
溫馨提示:為規(guī)避購買風險,建議您在購買產(chǎn)品前務必確認供應商資質(zhì)及產(chǎn)品質(zhì)量。