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化工儀器網(wǎng)>產(chǎn)品展廳>物理特性分析儀器>粒度儀>Zeta電位儀/微電泳儀>Nanolink SZ902 納米粒度分析儀

Nanolink SZ902 納米粒度分析儀

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  • 公司名稱 珠海真理光學(xué)儀器有限公司
  • 品牌 linkoptik/真理光學(xué)
  • 型號 Nanolink SZ902
  • 產(chǎn)地 珠海
  • 廠商性質(zhì) 生產(chǎn)廠家
  • 更新時間 2024/5/24 15:47:27
  • 訪問次數(shù) 3494

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真理光學(xué)儀器有限公司專注于Gao端顆粒表征儀器的研發(fā)和制造,產(chǎn)品涵蓋激光(衍射法)粒度分析儀、動態(tài)光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀,既有實(shí)驗(yàn)室儀器,又有在線檢測系統(tǒng)。真理光學(xué)秉持“科學(xué)態(tài)度,工匠精神”,為用戶提供世界Xian進(jìn)的Gao端產(chǎn)品和服務(wù)。

真理光學(xué)匯集了以張福根博士為代表的全國顆粒表征領(lǐng)域的頂尖人才。張福根博士現(xiàn)任本公司董事長兼首Xi科學(xué)家,還擔(dān)任全國顆粒表征及分檢與篩網(wǎng)標(biāo)準(zhǔn)化技術(shù)委員會副主任委員、天津大學(xué)兼職教授,曾擔(dān)任中國顆粒學(xué)會副理事長,同時也是“歐美克”字號公司的創(chuàng)始人。曾擔(dān)任英國某粒度儀器公司中國總經(jīng)理20余年的秦和義先生擔(dān)任本公司商務(wù)總經(jīng)理,中國顆粒學(xué)會青年理事潘林超博士、陳進(jìn)博士擔(dān)綱公司的研發(fā)主力。

激光(衍射法)粒度儀雖然已得到廣泛應(yīng)用,但它并不Wan美,不論是科學(xué)基礎(chǔ)方面,還是技術(shù)方案方面。真理光學(xué)的團(tuán)隊(duì)針對當(dāng)前市面上儀器存在的不足,展開了系統(tǒng)的理論研究和技術(shù)創(chuàng)新,發(fā)現(xiàn)了衍射光斑(愛里斑)的反常變化現(xiàn)象(ACAD),解釋了為什么不能測量3μm左右的聚苯乙烯微球,并給出了反常區(qū)(不能測量粒徑)的一般公式;研究了衍射儀器的測量上限和下限;研究了顆粒折射率偏差對測量結(jié)果的影響,發(fā)明了兩種根據(jù)散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術(shù)方案(Zhuan利),解決了前向超大角測量盲區(qū)的問題,使衍射儀器的亞微米顆粒測量水平顯著提高;提出了統(tǒng)一的反演算法(專有技術(shù)),消除了不同計(jì)算模式給出不同結(jié)果的尷尬;設(shè)計(jì)出了高達(dá)20Kfps的超高速并行數(shù)據(jù)采樣電路,使干法測量的精度不亞于濕法測量,對高速噴霧場的測量(時間)分辨率也更高。

在納米粒度及Zeta電位儀方面,真理光學(xué)提出了比相位分析法(PALS)更先進(jìn)的余弦擬合相位分析法(CF-PALS),用光纖分束取代了傳統(tǒng)的平板分束鏡分束,用光纖內(nèi)光干涉取代了自由空間干涉,使Zeta電位的測量重復(fù)性大幅度提高。

Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.

Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.

Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.

In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.




專注于顆粒(包含粉體顆粒、乳膠顆粒和液體霧滴)測試技術(shù)的研發(fā)和儀器的生產(chǎn)銷售

產(chǎn)地類別 國產(chǎn) 電位值范圍 無限制mV
價格區(qū)間 面議 應(yīng)用領(lǐng)域 醫(yī)療衛(wèi)生,生物產(chǎn)業(yè),能源
重復(fù)性 0.5%% 準(zhǔn)確性 0.6%

NanolinkSZ902系列納米激光粒度儀是繼在SZ901系列納米粒度分析儀后推出的全新一款高性能動態(tài)光散射納米粒度儀產(chǎn)品,加持了真理光學(xué)最新研發(fā)的全自動聚焦技術(shù),實(shí)現(xiàn)了對納米樣品的多角度測量,無需稀釋即可對不同濃度納米樣品的粒度及Zeta電位快速測量,十分適合各種有機(jī)或無機(jī)納米顆粒、乳液、高分子聚合物、膠束、病毒抗體及蛋白質(zhì)等多種樣品的粒度及Zeta電位研究級分析測試。


Nanolink SZ902納米粒度分析儀的杰出性能和主要特點(diǎn)包括:

   ◆包含經(jīng)典90°、背向和前向動態(tài)光散射技術(shù)測量粒徑,測量范圍覆蓋0.3nm–15μm*

   ◆激光多普勒電泳技術(shù)用于Zeta電位分析,可準(zhǔn)確預(yù)知分散體系的穩(wěn)定性及顆粒團(tuán)聚的傾向性

   ◆加持自動恒溫技術(shù)的最高功率可達(dá)50mW,波長638nm的固體激光光源,儀器即開即用

   ◆創(chuàng)新的余弦擬合相位分析法(CF-PALS)優(yōu)于目前的頻譜分析法(FFT)和傳統(tǒng)的位相分析法(PALS)

   ◆創(chuàng)新的激光光源與照明光及參考光的一體化及光纖分束技術(shù)

   ◆創(chuàng)新的信號光與參考光的光纖合束及干涉技術(shù)

   ◆集成光纖技術(shù)的高靈敏度和極低暗電流(20cps)的光子檢測器

   ◆常規(guī)溫度控制范圍可達(dá)-15°C~120°C,精度±0.1°C

   ◆新一代高速數(shù)字相關(guān)器,動態(tài)范圍大于1011

   ◆冷凝控制–干燥氣體吹掃技術(shù)


Nanolink SZ902納米粒度分析儀主要技術(shù)指標(biāo)

測量原理動態(tài)光散射(DLS)、靜態(tài)光散射(SLS)、電泳光散射(ELS)
粒徑測量角度90°,173°(高濃度),12°(Zeta電位)
粒徑測量范圍0.3nm -15um*
粒徑測量最小樣品量3ul*
粒徑測量最小樣品濃度0.1mg/ml
粒徑測量最大樣品濃度40%/wv**
檢測點(diǎn)位置距入射點(diǎn)0~5mm可調(diào)
檢測點(diǎn)定位精度0.01mm
Zeta電位測量技術(shù)余弦擬合位相分析法(CF-PALS)
Zeta電位測量范圍無實(shí)際限制
適用Zeta電位測量的粒徑1nm - 120μm*
遷移率范圍最小0,最大無實(shí)際限制
最大電導(dǎo)率270mS/cm
電極插入式平板電極、U型毛細(xì)管電極
分子量范圍340Da - 2x107Da
其它高級測量/計(jì)算功能介質(zhì)粘度、折光率、樣品透過率/濃度、第二維利系數(shù)、顆粒間相互作用力系數(shù)和聚集度指數(shù)
光源集成恒溫系統(tǒng)及光纖耦合的最大功率50mW, 波長638nm固體激光器
光強(qiáng)度調(diào)整范圍自動調(diào)節(jié),0.0001%~100%
相關(guān)器高速數(shù)字相關(guān)器,自適應(yīng)通道配置
檢測器高靈敏度APD
溫度控制范圍-15°C ~ 120°C
溫度控制精度±0.1°C
進(jìn)樣方式手動/自動
樣品池(選配)12mm比色皿、3μL毛細(xì)管超微量樣品池、40μL微量樣品池
環(huán)境要求5-40℃,10%-80%相對濕度(無凝結(jié))
工作電源AC100V-240V,標(biāo)準(zhǔn)接地,直流電源供電24V/5A
系統(tǒng)重量20kg
外形尺寸430mm x 500mm x 230mm (LxWxH)




   注:* 取決于樣品及樣品池選件    ** 取決于測量角度  







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