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化工儀器網(wǎng)>產(chǎn)品展廳>物理特性分析儀器>粒度儀>激光粒度儀>LT3600 粒徑分析儀

LT3600 粒徑分析儀

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  • 公司名稱 珠海真理光學(xué)儀器有限公司
  • 品牌 linkoptik/真理光學(xué)
  • 型號(hào) LT3600
  • 產(chǎn)地 珠海市
  • 廠商性質(zhì) 生產(chǎn)廠家
  • 更新時(shí)間 2021/2/5 10:50:05
  • 訪問次數(shù) 2440

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真理光學(xué)儀器有限公司專注于Gao端顆粒表征儀器的研發(fā)和制造,產(chǎn)品涵蓋激光(衍射法)粒度分析儀、動(dòng)態(tài)光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀,既有實(shí)驗(yàn)室儀器,又有在線檢測(cè)系統(tǒng)。真理光學(xué)秉持“科學(xué)態(tài)度,工匠精神”,為用戶提供世界Xian進(jìn)的Gao端產(chǎn)品和服務(wù)。

真理光學(xué)匯集了以張福根博士為代表的全國(guó)顆粒表征領(lǐng)域的頂尖人才。張福根博士現(xiàn)任本公司董事長(zhǎng)兼首Xi科學(xué)家,還擔(dān)任全國(guó)顆粒表征及分檢與篩網(wǎng)標(biāo)準(zhǔn)化技術(shù)委員會(huì)副主任委員、天津大學(xué)兼職教授,曾擔(dān)任中國(guó)顆粒學(xué)會(huì)副理事長(zhǎng),同時(shí)也是“歐美克”字號(hào)公司的創(chuàng)始人。曾擔(dān)任英國(guó)某粒度儀器公司中國(guó)總經(jīng)理20余年的秦和義先生擔(dān)任本公司商務(wù)總經(jīng)理,中國(guó)顆粒學(xué)會(huì)青年理事潘林超博士、陳進(jìn)博士擔(dān)綱公司的研發(fā)主力。

激光(衍射法)粒度儀雖然已得到廣泛應(yīng)用,但它并不Wan美,不論是科學(xué)基礎(chǔ)方面,還是技術(shù)方案方面。真理光學(xué)的團(tuán)隊(duì)針對(duì)當(dāng)前市面上儀器存在的不足,展開了系統(tǒng)的理論研究和技術(shù)創(chuàng)新,發(fā)現(xiàn)了衍射光斑(愛里斑)的反常變化現(xiàn)象(ACAD),解釋了為什么不能測(cè)量3μm左右的聚苯乙烯微球,并給出了反常區(qū)(不能測(cè)量粒徑)的一般公式;研究了衍射儀器的測(cè)量上限和下限;研究了顆粒折射率偏差對(duì)測(cè)量結(jié)果的影響,發(fā)明了兩種根據(jù)散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術(shù)方案(Zhuan利),解決了前向超大角測(cè)量盲區(qū)的問題,使衍射儀器的亞微米顆粒測(cè)量水平顯著提高;提出了統(tǒng)一的反演算法(專有技術(shù)),消除了不同計(jì)算模式給出不同結(jié)果的尷尬;設(shè)計(jì)出了高達(dá)20Kfps的超高速并行數(shù)據(jù)采樣電路,使干法測(cè)量的精度不亞于濕法測(cè)量,對(duì)高速噴霧場(chǎng)的測(cè)量(時(shí)間)分辨率也更高。

在納米粒度及Zeta電位儀方面,真理光學(xué)提出了比相位分析法(PALS)更先進(jìn)的余弦擬合相位分析法(CF-PALS),用光纖分束取代了傳統(tǒng)的平板分束鏡分束,用光纖內(nèi)光干涉取代了自由空間干涉,使Zeta電位的測(cè)量重復(fù)性大幅度提高。

Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.

Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.

Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.

In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.




專注于顆粒(包含粉體顆粒、乳膠顆粒和液體霧滴)測(cè)試技術(shù)的研發(fā)和儀器的生產(chǎn)銷售

   珠海真理光學(xué)儀器有限公司專注于顆粒表征和分析儀器的研發(fā)和生產(chǎn),公司聚集了多位在顆粒學(xué)和粉體技術(shù)領(lǐng)域具有豐富經(jīng)驗(yàn)和工作成就的精英人才,其涵蓋顆粒表征技術(shù)的基礎(chǔ)理論研究、應(yīng)用技術(shù)開發(fā)、產(chǎn)品制造、和商業(yè)運(yùn)營(yíng)服務(wù)。真理光學(xué)秉持以科學(xué)為先導(dǎo),運(yùn)用的技術(shù)手段,通過(guò)精細(xì)的管理,為客戶提供的粒度表征及應(yīng)用技術(shù)解決方案,其代表產(chǎn)品LT3600系列粒度分析儀更是基于多年的科研成果并融合多項(xiàng)技術(shù),為激光粒度分析行業(yè)樹立了新*。LT3600粒度儀被廣泛用于磨料,制藥,化工,電池材料,地質(zhì),水文等行業(yè)的顆粒粒度表征分析。

LT3600加持了以下多項(xiàng)創(chuàng)新和技術(shù):

    1、偏振濾波技術(shù)

    2、衍射愛里斑反常變化(ACAD)的補(bǔ)償修正技術(shù)

    3、斜置梯形測(cè)量窗口

    4、格柵式超大角檢測(cè)技術(shù)

    5、粒度分析模式優(yōu)化及自適應(yīng)技術(shù)

    6、雙驅(qū)動(dòng)進(jìn)樣分散集成技術(shù)

LT3600光學(xué)測(cè)量系統(tǒng)的性能還包括:

    1、符合ISO13320衍射法測(cè)量技術(shù)標(biāo)準(zhǔn)

    2、*的光路配置,超大連續(xù)的物理測(cè)量角度,無(wú)檢測(cè)盲區(qū)

    3、改進(jìn)型反演算法,用戶無(wú)需選擇“分析模式”,兼顧的分辨率和穩(wěn)定性

    4、無(wú)需更換透鏡,無(wú)需使用標(biāo)準(zhǔn)樣校準(zhǔn),量程范圍達(dá)到0.02微米至3600微米

    5、采用全息信號(hào)同步處理技術(shù),實(shí)時(shí)測(cè)量速度高達(dá)每秒20000次,不漏檢任何形狀和分布顆粒

       的衍射信息

    6、采用自動(dòng)溫度恒定技術(shù)的超高穩(wěn)定固體激光光源系統(tǒng),克服了氦氖氣體激光器預(yù)熱時(shí)間

       長(zhǎng),使用壽命短的缺點(diǎn)

    7、采用偏振空間濾波技術(shù),摒棄導(dǎo)致機(jī)械和熱穩(wěn)定性差的針孔濾波器

    8、金屬拉絲外殼設(shè)計(jì),兼顧耐用性和提高儀器的抗干擾能力



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