化工儀器網(wǎng)>產(chǎn)品展廳>分析儀器>光譜>光柵光譜儀(單色儀)>QTest Station Series 太陽(yáng)能電池光譜響應(yīng)/量子效率（QE/IPCE）測(cè)試系統(tǒng)
QTest Station Series 太陽(yáng)能電池光譜響應(yīng)/量子效率（QE/IPCE）測(cè)試系統(tǒng)
具體成交價(jià)以合同協(xié)議為準(zhǔn)
- 公司名稱(chēng) CROWNTECH（美國(guó)頤光科技有限公司中國(guó)辦事處）
- 品牌
- 型號(hào) QTest Station Series
- 產(chǎn)地 USA
- 廠商性質(zhì) 其他
- 更新時(shí)間 2017/7/4 20:57:17
- 訪問(wèn)次數(shù) 2723
產(chǎn)品標(biāo)簽
聯(lián)系我們時(shí)請(qǐng)說(shuō)明是化工儀器網(wǎng)上看到的信息，謝謝!
| QTest Station 1000 / 2000 Solar Cell Quantum Efficiency or IPCE Measurement System | |
| Features: | Applicable Photovoltaic Devices: |
| ◆ A turn key, fully automatic QE / IPCE measurement | Silicon |
| station in compliance with all major international | Si （crystalline） |
| standards for PV testing, such as ASTM and IEC | Si （multicrystalline） |
| etc. | Si （thin-film transfer） |
| ◆State of the art system suited for all categories of | Amorphous/nanocrystalline Si |
| PV devices | Si （amorphous） |
| ◆Multi-junction solar cell measurement | Si （nanocrystalline） |
| ◆Extremely stable light source and high signal to | III–V cells |
| noise ratio | GaAs （crystalline） |
| ◆Wide spectral range from deep UV to MID-IR, | GaAs （thin film） |
| extendable to other range | GaAs （multicrystalline） |
| ◆Integrating sphere module for both External QE | InP （crystalline） |
| and Internal QE testing | Thin-film chalcogenide |
| ◆ Measurement of PV devices with slow time | CIGS （cell） |
| response, such as dye sensitised | CdTe （cell） |
| ◆Calculation of Isc under AM0, AM1.5D and AM1.5G | Photochemical |
| ◆ System expandable to PL measurement with | Dye sensitised |
| optional modules for customers with limited budget | Organic |
| ◆Advanced modular design with a great variety of | Organic polymer |
| options to best fit the need of individual laboratory | Multijunction devices |
| ◆ Intuitive Interface for operations | GaInP/GaAs/Ge |
| ◆ Appropriate for use in either research and | GaInP/GaAs |
| development applications or in product quality | GaAs/CIS （thin film） |
| control by manufacturers | a-Si/mc-S |
| The spectral responsivity of a photovoltaic device is useful for understanding device performance and materia |
| characteristics. The quantum efficiency （QE） or IPCE is a quantity defined as the percentage of photons |
| hitting the photoreactive surface that will produce the current obtained outside the device,and normally reported |
| over the wavelength range λ.（unit: nm） to which the device responds: |
| QE（λ） = 1240 R（λ）/λ |
| In which, R（λ） （unit: A/W） is defined as the output current （short circuit current） per input irradiance |
| or radiant power at a given wavelength. |
| QE or IPCE is an accurate measurement of the device's electrical sensitivity to light. The Quantum Efficiency |
| of a solar cell is a very important measure for solar cells as it gives information on the current that a given cell |
| will produce when illuminated by a particular wavelength. If the quantum efficiency is integrated （summed） over |
| the whole solar electromagnetic spectrum, one can evaluate the current that a cell will produce |
| when exposed to the solar spectrum. The ratio between this current and the highest possible |
| current （if the QE was * over the whole spectrum） gives the electrical efficiency of the solar cell. System Specifications: |
| Light Source | 250nm – 2500nm, Other Wavelength Optional | |||
| Monochromator | 185nm – 3600nm, Others Wavelength Optional | |||
| Calibration Detector | Si: 200 nm – 1100nm | |||
| InGaAs and Others Optional | ||||
| Wavelength Resolution | 0.1nm – 20nm | |||
| Stray Light | Single Monochromator, Better Than 10-4at 220nm （Nal） For QTest 1000 | |||
| Double Monochromator, Better Than 10-9 at 220nm （Nal） For QTest 2000 | ||||
| Sample Illuminating Area | From Sub-millimeter to 156 x | |||
| Sample Chamber | D500 x W400 x H | |||
| Data Acquisition Module | AC Measurement: Lock-in Amplifier Sensitivity: 2 nV to 1 V Current input: 106 or 108 V/A | |||
| DC Measurement: Multimeter / Source Meter and Pre-amplifier | ||||
| Computer Interface | RS232 Standard, USB and IEEE-488 optional | |||
| Software | Hardware Setup and Control: Wavelength Scanning Input / Output Slits Adjustment Gratings changing Filter Wheel Control Setup and Data Collection of Lock-in Amplifier or Multimeter / Source Meter | Data Acquisition: Real Time Display System Calibration Data Analyzing Data Storage Report printing Reflectivity and Transmittance for EQE and IQE | ||
| Other options | Temperature Control Multijunction Cell Measurements | |||
采購(gòu)中心
化工儀器網(wǎng)